This report presents a Digital Floorplan Analysis of the NXP N54W die found inside the Freescale PCIMX7U5DVP08SC component.

This report contains the following detailed information:

• Selected teardown photographs, package photographs, package X-rays, die markings, and die photographs
• Scanning electron microscopy (SEM) plan-view micrographs showing the layout of the die at the levels including, fin/shallow trench isolation (STI), gate, contacts, and minimum pitch metals
• Measurements of horizontal dimensions of some of the major layout features, particularly the pitch and track height of standard cells
• Plan-view optical micrograph of the die delayered to the gate level
• Identification of major functional blocks on the gate level die photograph
• Table of functional block sizes and percentage die utilization
• High-resolution top metal and polysilicon level die photographs delivered in the CircuitVision software