The following is a Circuit Vision Analysis report on the Samsung K9DUGY8J5B-DCK0 (with a die marking of K9AFGD8J0B) 92-layer NAND flash I/O buffer area. The report contains a full set of schematics and annotated photographs divided into the following sections:
- Architectural Overview
- I/O Buffer
- Standard Cells
- Appendix A - Signal List