The BEF includes a summary of observed device metrics and salient features with supporting images and data. The summary is supported by the following unannotated image folders:
- Product teardown images
- Package optical photographs and package X-Ray
- Electrochemical impedance spectroscopy of the battery
- Differential capacity analysis of the battery
- Plan-view SEM images of the separated battery layers
- Optical and cross-sectional scanning electron microscope (SEM) images of the battery structure
- Results of SEM-based energy dispersive spectroscopy (SEM-EDS) analysis of the battery materials
- X-ray powder diffraction (XRD) of the anode and cathode
- Fourier-Transform infrared (FTIR) analysis of the separator
- Gas chromatography mass spectrometry (GCMS) analysis of the electrolyte solution
The authoritative information platform to the semiconductor industry.
Discover why TechInsights stands as the semiconductor industry's most trusted source for actionable, in-depth intelligence.
1891 Robertson Rd #500, Nepean, ON K2H 5B7
Copyright © 2024 TechInsights Inc. All rights reserved.