
The image set for a standard PFR project is derived from decapsulation of two samples, followed by scanning electron microscopy (SEM) analysis of a cross-section of the power transistor die and optical analysis of the power transistor die delayered to the substrate or gate level. The PFR deliverable includes:
- Company Profile
- Executive Summary
- Downstream Identification (optional)
- Device Identification
- Process Analysis
- Layout Analysis
- Cost Analysis