Chipworks Process Node Assessment Reports provide clients with fundamental but essential device information, such as process design and technology node determined by cross section. The key value of a process node assessment is to get a snapshot of a target device, to help you determine whether further analysis is warranted or not. This report contains the following detailed information: package photographs, package X-ray, die markings, die photograph, and die photographs with annotated functional blocks and memories, measurements of vertical and horizontal dimensions of major microstructural features, scanning electron microscopy (SEM) cross-sectional micrographs of dielectric materials, major features, transistors, and plan-view optical micrographs of the part delayered to the polysilicon layer.