The report includes
- Downstream product features and SoC-level areas of analysis
- Technology node contact and back-end-of-line (BEOL) process architecture assessment with stack up dimensions
- Features and dummy structures of the system-on-chip (SoC) design overhead associated with the transition between design IP blocks
- Scanning electron microscope (SEM) montage of a planar sample area delivered in CircuitVision
- Target areas are typically transitions between different types of IP blocks, such as analog I/O to digital, or to memory, and typically contain many dummy features
- Standard cell architecture by extraction and placement of multiple standard cells in the TB3 I/O logic layout
- Routing density of the TB3 I/O logic digital logic library
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