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Published: 2 October 2018


This report presents a Basic Functional Analysis of the Samsung S5K4H7YX BI CIS found inside the front camera module of the Meizu M712Q-B Meilan S6.

This report contains the following detailed information:

  • Selected teardown photographs, package photographs, package X-rays, die markings, and die photographs
  • SEM cross-sectional micrographs of the general structure of the die dielectric materials, major features, and transistors
  • Measurements of vertical and horizontal dimensions of major microstructural features
  • Plan-view optical micrograph of the die delayered to the polysilicon layer
  • Identification of major functional blocks on a polysilicon die photograph
  • Table of functional block sizes and percentage die utilization
  • High-resolution top metal and polysilicon die photographs delivered in the ICWorks Browser
  • Cost of die and tested packaged die, based on the manufacturing cost analysis of the observed process

Report Description

This report presents a Basic Functional Analysis of the Samsung S5K4H7YX BI CIS found inside the front camera module of the Meizu M712Q-B Meilan S6.

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