Product Code
FAR-1810-801
Release Date
Availability
Published
Product Item Code
NXP-100VB27
Device Manufacturer
NXP Semiconductors
Device Type
NFC Controller
Subscription
IoT Connectivity SoC
Channel
IoT Connectivity SoC - Transceiver Floorplan
NXP Semiconductors 100VB27 NFC Controller Basic Functional Analysis
This report presents a Basic Functional Analysis of the NXP 100VB27 die found inside NXP 100VB27 package.

This report contains the following detailed information:
  • Selected teardown photographs, package photographs, package X-rays, die markings, and diephotographs
  • SEM cross-sectional micrographs of the general structure of the die dielectric materials, majorfeatures, and transistors
  • Measurements of vertical and horizontal dimensions of major microstructural features
  • Plan-view optical micrograph of the die delayered to the polysilicon layer
  • Identification of major functional blocks on a polysilicon die photograph
  • Table of functional block sizes and percentage die utilization
  • High-resolution top metal and polysilicon die photographs delivered in the ICWorks Browser
  • Cost of die and tested packaged die, based on the manufacturing cost analysis of the observed process
 

Make informed business decisions faster and with greater confidence

Start My Free Trial

 

The authoritative information platform to the semiconductor industry.

Discover why TechInsights stands as the semiconductor industry's most trusted source for actionable, in-depth intelligence.