Webinar: Finding Evidence of Use in Technology - the Good, the Bad, and the Ugly

Originally Presented: December 12, 2018 / 2:00pm to 3:00pm ET
Hosted By: Martin Bijman

TechInsights has identified Evidence of Use (EoU) for over 6,000 unique patents. In doing so, we have significantly evolved our understanding of what patents can be supported with EOU and honed our expertise in mapping claim elements to evidence – sometimes in very difficult to detect applications. We develop imaginative new ways to find EoU when we encounter technology challenges, such as:

  • Identifying materials used in the creation of a semiconductor chip
  • Determining structures and operation of a sea of gates
  • Testing location-specific products
  • Finding software innovations in embedded applications
  • Determining implementations of features in the cloud
  • Working around encrypted environments

Because of the complexity that can be involved in finding some evidence, the key deciding factors often come down to cost, time, and likelihood of success. To manage risk, projects are staged so that success is achieved in incremental steps.

This program will address:

  • The deepest technical analysis methods required to prove claim elements
  • Some examples of success, to give a context of what is achievable
  • A summary of types of challenges that can be considered difficult or prohibitive

December 12, 2018

2:00pm to 3:00pm ET

Duration 1 Hour

About The Host

Expert who will be conducting this webinar

Martin Bijman

Martin Bijman

Director, IP Products

Martin Bijman is director, intellectual property products at TechInsights, where he is responsible for ensuring customers find and receive the highest value products and services to help achieve their IP goals. Martin previously worked at Chipworks for more than ten years.