The complete APE deliverable includes a concise analyst’s summary of critical device metrics, scanning electron microscopy (SEM) based energy dispersiveX-ray spectroscopy (SEM-EDS) of package materials, and salient features supported by the following images:
- Downstream product teardown
- Package photographs and X-rays
- Die photographs
- Optical planar view images of selected PWB metal layers
- SEM, TEM, and optical cross section of the general package structure, metals, dielectric materials, die, TSV and package interconnect structure
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